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Magazine Name : Microelectronics Journal

Year : 2002 Volume number : 33 Issue: 08

Thickness Dependent Soft-Breakdown Phenomena Of Low Dielectric Constant Thin Films Corresponding Activation Energy (Article)
Subject: Thickness Dependent , Soft-Breakdown , Low Dielectric Constant
Author: S. Lee      W.-H Kim      Y. Zhao     
page:      605 - 608
High-Voltage Solutions In Cmos Technology (Article)
Subject: High-Voltage Laboratory , Power Integrated Circuits , Cmos Compatible
Author: A Santos      A.P. Casimiro      P Lancaste     
page:      609 - 618
Thermal Model Of Thin Film Anemometer (Article)
Subject: Thermal Sensor , Flow Measurements , Conventional
Author: A. Giani      F. Mailly      R. Bonnot     
page:      619 - 626
Validation Of A Novel Dielectric Constant Simulation Model And The Determination Of Its Physical Parameters (Article)
Subject: Dielectric Constant , Effective Medium Theory
Author: Micheal G. Todd      Frank G. Shi     
page:      627 - 632
An Analytic Al 2d Model For Drain -Induced Barrier Lowering In Subquater Micrometer Gate Length In Aias/Ingas/Inaias/Inp Lmhemt (Article)
Subject: Drain Induced Barrier Lowering , Channel Potential , Field Distribution
Author: Jyotika Jogi      Subjajit Sen      Gupta Mirdula      R.S. Gupta     
page:      632 - 638
Characterization Of Interface Degradation In Deep Submicronmosfets By Gate Controlled -Diode Measurement (Article)
Subject: Mosfets , Gate-Controlled -Diode , Fowler , Interface
Author: J.-T Huang      T.P. Chen      M.S. Tse     
page:      639 - 644
Effect Of Different Etching Processes On Edge Breakdown Supression For Planar Inp/Ingaap Avalanche Photodiodes (Article)
Subject: Avalanjche Photodiodes(Apds) , Edge Breakdown , Optical Receiver
Author: B Lee      I. Yun     
page:      645 - 650
Novel Method Of Low-Vaccum Plasma Triode Sputtering (Article)
Subject: Tetrode Sputtering , Silicon , Titanium Iron
Author: G. Golan      A. Axelevitch     
page:      651 - 658
Optimization Of A 0.6 Um, Single Polysilicon Emitter Bipolar Technology Versus Narrow Emitter Effects (Article)
Subject: Bipolar Transistor , Semi Conductor Device Fabrication , Semiconductor Device Metallization , Optimization Methods
Author: M. Ullan      M. Lozano      J. Santander      E. Lora Tamayo     
page:      659 - 666
Normalized Mutual Integral Difference Operator: A Novel Eeperimental For Extracting Threshold Voltage Of Mosfets (Article)
Subject: Normalized Mutual Integral Differnce Operator , Mosfet Devices , Threshold Voltage , Series Resistance Effect
Author: J. H He      X .L Zhang      Y. Wang      X. Xia     
page:      667 - 670
Weak Light Effect In Multicrystalline Silicon Solar Cells (Article)
Subject: Weak Light Effect , Solar Cell , Open Circuit Voltage , Multicrystalline Silicon
Author: H Wang      H Yang      H. Yu      H.-L Hu     
page:      671 - 674
Neural Network Based Modeling Of Diffusion Process For High Speed Avalanche Photodiodes Fabrication (Article)
Subject: Diffusion , Neural Network , Avalanjche Photodiodes(Apds)
Author: Young-Don Ko      Yong Hwan Kwon     
page:      675 - 680